首页> 外文OA文献 >Suppression of conductivity deterioration of copper thin films by coating with atomic-layer materials
【2h】

Suppression of conductivity deterioration of copper thin films by coating with atomic-layer materials

机译:涂原子层材料抑制铜薄膜导电性的下降

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Theoretical calculations are performed to explore the electronic structures and electron conducting properties of copper (Cu) thin films coated with graphene or h-boron-nitride (h-BN) layers. The Shockley surface states of Cu surfaces are preserved by the graphene and h-BN coatings which prevent the surface oxidation of Cu because of the weak interaction between the Cu surface and graphene or the h-BN layers. Furthermore, the Shockley surface states in Cu thin films possess quasi-two dimensional free-electron characteristics and exhibit a high conductivity of 1.62 × 107 (Ωm)−1 at room temperature. These hybrid structures may be suitable as interconnects in memory devices that can stably store data for long periods.
机译:进行理论计算以探索涂有石墨烯或h-氮化硼(h-BN)层的铜(Cu)薄膜的电子结构和电子导电性能。石墨烯和h-BN涂层保留了Cu表面的Shockley表面态,由于铜表面与石墨烯或h-BN层之间的相互作用较弱,因此可以防止Cu的表面氧化。此外,Cu薄膜的肖克利表面态具有准二维自由电子特性,在室温下具有1.62 1.6×107(Ωm)-1的高电导率。这些混合结构可以适合作为可以长期稳定地存储数据的存储设备中的互连。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号